Feature

• Wide film thickness range （1nm～1mm)
• Thickness measurement using reflection spectrum
• Compact and affordable without compromising high precision
• User friendly software interface.
• Analytical algorisms are Peak-Valley Method, Fast Fourier Transformation (FFT) Method, Non-linear Least-Squares Method and Optimization Method.
• Optical constant analysis (n: Refractive index, k: Extinction coefficient) with Non-linear Least-Squares Method

 

Measure Item

• Absolute reflectance
• Film thickness(Up to 10 layers)
• Optical constant(n: Refractive index, k: Extinction coefficient)

 

Application

• Function film, Plastic
  
  Transparent film（ITO, Silver nanowire） Retardation film, Polarization film, AR film, PET, PEN, TAC, PP, PC, PE, PVA, Adhesive, Protect film, Hard coat
• Semiconductor, Compound semiconductor
  
  Si, oxide film, nitride film, Resist, SiC, GaAs, GaN, InP, InGaAs, Leadframe, SOI, Sapphire
• Surface treatment
  
  DLC, Anti-rust, Anti-fog additive
• Optical materia
  
  Filter, AR coating
• FPD
  
  LCD（CF, ITO, LC, PI, PS）, OLED
• Others
  
  HDD, Magnetic tape, Construction material